{"product_id":"scanning-electron-microscopy-and-x-ray-microanalysis-springer-verlag-new-york-inc-9781493966745-dale-e-newbury","title":"Scanning Electron Microscopy and X-Ray Microanalysis","description":"\u003cp\u003e\u003cstrong\u003eScanning Electron Microscopy and X-Ray Microanalysis\u003c\/strong\u003e by Goldstein, Joseph, Dale E. Newbury, David joy, Patrick Echlin, Eric Lifshin, Linda Sawyer, Charles E. Lyman, Joseph R. Michael.\u003c\/p\u003e\n\u003cp\u003ePublished by Springer, (2017), Hardback, 550 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Scanning electron microscopy, X-ray microanalysis, Scanning electron microscopes, X-rays.\u003c\/p\u003e","brand":"Dale E. Newbury","offers":[{"title":"Default Title","offer_id":52229657723222,"sku":"9781493966745","price":121.24,"currency_code":"EUR","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9781493966745.jpg?v=1767745356","url":"https:\/\/www.laufgard.com\/products\/scanning-electron-microscopy-and-x-ray-microanalysis-springer-verlag-new-york-inc-9781493966745-dale-e-newbury","provider":"Bookshop","version":"1.0","type":"link"}