Atom Probe Microscopy

Discover the comprehensive world of atom probe microscopy with Atom Probe Microscopy by Baptiste Gault, published by Springer-Verlag New York Inc. in 2014. This insightful book spans 396 pages and delves into various aspects of atom probe microscopy, including field ion microscopy and field desorption microscopy, while placing a significant emphasis on atom probe tomography. Whether you are a seasoned researcher or new to the field, this book serves as an essential resource that caters to all experience levels. Enhance your understanding of advanced microscopy techniques and their applications with this must-have addition to your scientific library.