Test Generation of Crosstalk Delay Faults in VLSI Circuits

Discover the intricacies of VLSI circuit testing with "Test Generation of Crosstalk Delay Faults in VLSI Circuits" by S. Jayanthy. Published by Springer Verlag in 2018, this insightful paperback spans 156 pages and offers a comprehensive exploration of crosstalk delay models and the latest test generation algorithms for delay faults. The book delves into both deterministic and simulation-based algorithms, providing readers with a robust understanding of how to effectively test crosstalk delay faults. This essential resource is perfect for professionals and students alike, looking to enhance their knowledge in VLSI circuit design and testing methodologies. Whether you are a seasoned engineer or a curious learner, this book is a must-have addition to your library.