VLSI Design and Test

Discover the cutting-edge world of VLSI design with VLSI Design and Test by Anirban Sengupta. This comprehensive volume, published by Springer Verlag in 2019, features the refereed proceedings of the 23rd International Symposium on VLSI Design and Test, held in Indore, India. Spanning 775 pages, this essential resource includes 63 meticulously reviewed papers selected from a competitive pool of 199 submissions. Each paper is organized into topical sections, covering critical areas such as analog and mixed signal design, providing valuable insights for both researchers and practitioners in the field. Enhance your understanding of VLSI technology and its applications with this authoritative guide. Perfect for anyone looking to deepen their knowledge in VLSI design, this book is a must-have for your collection.