VLSI Fault Modeling and Testing Techniques

Discover the essential guide to VLSI fault modeling and testing techniques in the groundbreaking book, VLSI Fault Modeling and Testing Techniques by George W. Zobrist. Published by Bloomsbury Publishing Plc in 1993, this invaluable resource spans 200 pages and delves into critical aspects of integrated circuits and computer architecture. Zobrist expertly covers a range of topics, including physical fault modeling and simulation for VLSI MOS circuits, designing CMOS gates to effectively test for open faults, and innovative approaches to testing bridging faults in VLSI systems. Whether you are a student, researcher, or professional in the field of computer modeling and data processing, this book provides essential insights and practical methodologies necessary for advancing your expertise in VLSI technology. Don’t miss out on the chance to enhance your understanding of fault diagnosis and testing methodologies that are fundamental to modern electronic design.